Innovative Spectral Techniques for Accurate Material Assessment Skip to main content

Innovative Spectral Techniques for Accurate Material Assessment ID: 2024-004

Introducing a groundbreaking approach to X-ray Photoelectron Spectroscopy data collection that enhances statistical analysis and sample assessment.

microscope image for ID: 2024-006
Photo by Konstantin Kolosov

Technology Overview:

This technology represents a shift in X-ray Photoelectron Spectroscopy (XPS) data collection methodologies by adopting a 'constant signal, variable time' approach as opposed to the traditional 'variable signal, constant time' methods. This innovative technique focuses on maintaining a constant signal while varying the acquisition time for each data point, aiming to improve statistical analyses, visual comparisons, and the overall reliability of spectroscopic studies.


Key Advantages

  • Enables more precise statistical analyses and visual comparisons.
  • Improves the identification of changes in XPS spectra, facilitating better target detection and sample damage assessment.
  • Potentially applicable to a wide range of spectroscopies beyond XPS.
  • Offers a new way to model spectra with a Poisson distribution, allowing for more sophisticated statistical tests.
  • Supports the use of negative binomial regression for better handling of variances and deviations, enhancing error detection.

Problems Solved

  • Challenges in detecting subtle changes in XPS spectra for damage studies and target detection.
  • Limited statistical tools for analyzing traditional XPS data.
  • Constraints of commercial XPS software in accommodating advanced data collection methodologies.

Market Applications

  • Advanced chemical speciation in materials science.
  • Enhanced target detection in hyperspectral imaging applications.
  • Improved damage assessment in a variety of samples.
  • Development of custom software solutions for spectroscopy analysis.
  • Research and development in spectroscopy technology.

Stage of Development

This technology is in the conceptual stage. It has not been prototyped due to current limitations in modifying existing XPS instrument software, but it suggests potential for experimental replication at advanced facilities or by manufacturers.


Additional Information

Technology ID: 2024-004
Sell Sheet: Download the Sell Sheet here
Marketing Analysis: Link to Market Analysis here
Date Published: March 18, 2025

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